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James R. Engstrom

Professor
Engstrom
  • B.Ch.E., University of Minnesota (1981)
  • Ph.D., California Institute of Technology (1987)
  • Postdoctoral Research, University of Washington (1987-89)
  • BP/Amoco H. Laurance Fuller Professor (2005)
  • Fellow, American Vacuum Society (2005)
  • College of Engineering Teaching Award, Cornell University (2003 and 1995)
  • STA Nuclear Fellowship, Science and Technology Agency of Japan (1996)
  • Lilly Endowment Teaching Fellow (1995)
  • National Science Foundation Presidential Young Investigator Award (1991)

Prof. Engstrom’s research examines the behavior of surfaces and interfaces as they relate to a broad spectrum of technologies: from the fabrication of modern microelectronic devices, to materials with applications in lightweight and flexible displays, to solar cells incorporating nanocrystals, to electrocatalysts for fuel cells. At the heart of all of these projects is the desire to build a fundamental understanding of these processes using the tools of the experimental surface scientist. A primary tool employed in the group is the use of supersonic molecular beam scattering, which is the most powerful probe of gas-surface interactions. The group also uses a variety of spectroscopic techniques such as x-ray photoelectron spectroscopy, low-energy electron diffraction, and low-energy ion scattering. Quadrupole mass spectrometry is a mainstay of all experimental systems in the group. Techniques new to the group include the use of scanning tunneling microscopy (STM), a technique that can produce atomic-resolution images of surfaces, and synchrotron x-ray scattering, a technique that can be used in situ and in real time to monitor crystal growth with atomic and molecular-layer precision.

Contact Information

354 Olin Hall
Cornell University
Ithaca, NY 14853
Phone: 607-255-9934
Fax: 607-255-9166
Email: jre7@cornell.edu

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